Advanced Transmission Electron Microscopy: Imaging and by Jian Min Zuo, John C.H. Spence

By Jian Min Zuo, John C.H. Spence

This quantity expands and updates the assurance within the authors' renowned 1992 booklet, Electron Microdiffraction. because the identify implies, the point of interest of the ebook has replaced from electron microdiffraction and convergent beam electron diffraction to all different types of complicated transmission electron microscopy. distinct awareness is given to electron diffraction and imaging, together with high-resolution TEM and STEM imaging, and the applying of those easy methods to crystals, their defects, and nanostructures. The authoritative textual content summarizes and develops lots of the valuable wisdom which has been won through the years from the examine of the a number of electron scattering challenge, the new improvement of aberration correctors and their purposes to fabrics constitution characterization, in addition to the authors' vast instructing adventure in those components. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is perfect to be used as a sophisticated undergraduate or graduate point textual content in help after all fabrics in fabrics technological know-how, Physics or Chemistry departments.

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1 T ð2:39Þ 0 To evaluate the integral in Eq. , the time delay exceeds the coherence time. The phase difference is then given by the difference between two random phases, which gives another random phase, so that dðtÞ À dðt þ sÞ ¼ D. The integral over random phases averages to zero, and thus, c12 ðsÞ = 0 for s [ so . 34 2 Electron Waves and Wave Propagation For 0\s\so , we have the following two scenarios & dðtÞ À dðt þ sÞ ¼ 0; 0\t\so À s Dn À Dn þ 1 ; so À s\t\so This applies to every coherent period in the quasi-monochromatic wave.

Characterization forms an essential part of this endeavor. Transmission electron microscopy, more than any other techniques, has contributed to our knowledge of materials microstructure because of the large electron elastic scattering cross section and electron imaging. In particular, the combination of the large scattering cross sections and a small probe (down to subnanometer dimensions) makes TEM the essential characterization tool for nanoscience and nanotechnology, which gives the strongest signal from the smallest volume of matter of any analysis technique.

37). The wave packet is thus again described by a Gaussian function, and its center moves with the so-called group velocity hko =m. Its width increases with time pffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffi pffiffiffi according to 2prk = 1 þ C2 t2 . The rate of wave packet broadening is given by C. As wewill  see in later chapters, the relationship between the frequency and wave ~ vector x k is modified by electron interaction with the potential, and it becomes a general function of ~ k in  a complex form. 7 The Gaussian Wave Packet and Its Propagation xðkÞ ¼ xðko Þ þ ðk À ko Þx0 ðko Þ þ ¼ 2p ko vp þ ðk À ko Þvg þ 33 1 ðk À ko Þ2 x00 ðko Þ þ Á Á Á 2 !

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